Charge Transfer in Double MIG Pixel
March 22nd, 2012
The Non-Destructive Correlated Double Sampling (NDCDS) is enabled by the ability to transfer signal charge continuously between two MIGs. Below is a video which demonstrates how charge can be transferred in a basic double MIG pixel. Both simulation and measurement results are shown. The measurement is taken from a single pixel test structure which don’t Read the Rest…
1T MIG Pixel
March 15th, 2012
We think that future image sensor pixels should be more simple and elegant and that they should offer better performance than is possible today. The present 4T CMOS pixel has been pushed towards its limits and yet the image quality should be improved. New approaches are needed to overcome the challenges in today’s technologies. Please Read the Rest…